With a fab line yield of
consistently 98-99 per cent and
world-class levels of electrical
wafer sort yield, we strive to
meet our customers’ production
needs for volume market delivery
and the highest possible quality
wafers.
Extending the close co-operation
with the customers in the
prototyping phase, our
engineering team prepares the
product for volume production.
Corner lots or matrix lots are
normally processed to determine
the process fit and margins
between the design and process.
Yield roadmaps and yield
improvement activities are
systematically planned together
with the customers to
effectively bring the customer
product to mass production. Such
close cooperation and mutual
learning help ensure that
world-class yield levels are
achieved quickly.
As an integral part of our yield
improvement efforts, we are
constantly monitoring and
studying all possible methods to
reduce the defect density for
the wafer manufacturing
processes. One approach is to
implement best-known-methods
from our motherfabs. Another is
the continuous monitoring and
feedback of defect levels from
all fab processing tools.
To support yield and baseline
defect density improvements, we
are equipped with a full-scale
Failure Analysis lab and an
experienced team that provide
extensive and advanced Failure
Analysis services.
The
chart below gives a brief
overview of the whole process
undertaken to ensure
best-in-class D0 performances.

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